The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Dec. 19, 2019
Applicant:

Tdk Corporation, Tokyo, JP;

Inventor:

Takeshi Tsutsumi, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/88 (2006.01); G01N 21/95 (2006.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01N 21/8851 (2013.01); G01N 21/9501 (2013.01); G06K 9/6256 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30148 (2013.01);
Abstract

An image generation device and an appearance inspection device which can increase the number of types of training image are provided. An image generation device includes an image acquisition unit configured to acquire a first image; and an image generator configured to generate a training image based on the first image, wherein the first image depicts a first defect included in a first product of a different type the product to be inspected, and the training image is a image to be read by an identifier that identifies whether an inspection image obtained by imaging the product to be inspected depicts a same type of defect as the first defect and to be used by the identifier to perform learning.


Find Patent Forward Citations

Tsutsumi, Takeshi. (2022). Image generation device and appearance inspection device (U.S. Patent No. 11373292). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11373292

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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