The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Mar. 16, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Pedro Manuel Da Silva Quelhas, Sunnyvale, CA (US);

Moinul Khan, San Jose, CA (US);

Raffi A. Bedikian, Mountain View, CA (US);

Katharina Buckl, Starnberg, DE;

Mohamed Selim Ben Himane, Milpitas, CA (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/00 (2006.01); G06T 1/60 (2006.01); G06F 3/01 (2006.01); G06T 7/50 (2017.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 3/0093 (2013.01); G06F 3/013 (2013.01); G06T 1/60 (2013.01); G06T 3/0056 (2013.01); G06T 5/005 (2013.01); G06T 7/50 (2017.01); G06T 2200/16 (2013.01);
Abstract

A method includes obtaining an image via an image sensor, and identifying, within the image, a physical object represented by a portion of the image. The method includes determining, based on the image, a visual feature characterizing the physical object. The method includes warping, based on the visual feature satisfying a first feature criterion, the portion of the image according to a first warping function that is based on the first feature criterion and a distance between the electronic device and a reference point. The method includes warping, based on the visual feature satisfying a second feature criterion that is different from the first feature criterion, the portion of the image according to a second warping function that is based on the second feature criterion and the distance between the electronic device and the reference point.


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