The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Dec. 14, 2020
Applicant:

United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);

Inventors:

Peter D. Juarez, Hampton, VA (US);

Elizabeth D. Gregory, Hampton, VA (US);

K. Elliott Cramer, Yorktown, VA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B 41/00 (2006.01); G06T 1/00 (2006.01); B29C 70/38 (2006.01); B29C 70/54 (2006.01); G06T 7/90 (2017.01); H04N 5/33 (2006.01); G01N 21/88 (2006.01); G01J 5/10 (2006.01); G01J 5/00 (2022.01); G01J 5/48 (2022.01);
U.S. Cl.
CPC ...
G06T 1/0014 (2013.01); B29C 70/384 (2013.01); B29C 70/54 (2013.01); G01J 5/10 (2013.01); G01N 21/8851 (2013.01); G06T 7/90 (2017.01); H04N 5/33 (2013.01); G01J 5/48 (2013.01); G01J 2005/0077 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30124 (2013.01);
Abstract

A method of detecting defects in a composite structure includes applying heat to a surface of a composite structure. Thermographic images or frames captured by a moving camera may be utilized to corm temporally aligned images that include temperature data (pixels) from a plurality of frames, wherein the pixels comprise data captured at a simple (uniform) time delay from the time at which heat was applied. The temporally aligned thermographic data for the surface region may include variations due to differences in thermal transients caused by defects in the composite structure. The variations in the thermographic data may be utilized to detect one or more defects in the composite structure.


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