The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

May. 17, 2019
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Shih-Jong James Lee, Bellevue, WA (US);

Hideki Sasaki, Bellevue, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06N 3/04 (2006.01); G06K 9/00 (2022.01); G06V 30/194 (2022.01);
U.S. Cl.
CPC ...
G06K 9/627 (2013.01); G06K 9/00523 (2013.01); G06K 9/00536 (2013.01); G06N 3/04 (2013.01); G06V 30/194 (2022.01);
Abstract

A computerized method of deep model matching for image transformation includes inputting pilot data and pre-trained deep model library into computer memories; performing a model matching scoring using the pilot data and the pre-trained deep model library to generate model matching score; and performing a model matching decision using the model matching score to generate a model matching decision output. Additional pilot data may be used to perform the model matching scoring and the model matching decision iteratively to obtain improved model matching decision output. Alternatively, the pre-trained deep model library may be pre-trained deep adversarial model library in the method.


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