The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Sep. 24, 2019
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Takuji Tada, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0068 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01); G02B 21/36 (2013.01); G01N 2201/0638 (2013.01);
Abstract

The sample imaging apparatus includes: an imaging unit that images a sample by using an achromatic lens in which longitudinal chromatic aberration is corrected in a wavelength range of chemiluminescent light of the sample; an excitation light source (the first epi-illumination light source and/or the second epi-illumination light source) that irradiates the sample with excitation light for causing the sample to emit fluorescent light; and an imaging control unit that adjusts a focal length of the achromatic lens in each imaging in a case of imaging the single sample a plurality of times by changing a wavelength range of the fluorescent light emitted by the sample, and performs imaging in a wavelength order of the fluorescent light used for the imaging.


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