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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11372224 B1

PDFFull Text
Date of Patent:
Jun. 28, 2022

Filed:

Oct. 19, 2018

Method of stimulated emission depletion microscopy having high spatial resolution

Applicant:

Fondazione Istituto Italiano Di Tecnologia, Genoa, IT;

Inventors:

Luca Lanzano', Genoa, IT;

Paolo Bianchini, Genoa, IT;

Giuseppe Vicidomini, Genoa, IT;

Alberto Diaspro, Genoa, IT;

Assignee:

Fondazione Istituto Italiano di Tecnologia, Genoa, IT;

Attorney:

Merchant & Gould P.C.

Primary Examiner:

David P Porta

Assistant Examiner:

Shun Lee

Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G01N 21/6458 (2013.01); G01N 21/6486 (2013.01); G02B 21/0084 (2013.01); G02B 21/365 (2013.01);
Abstract

Method for increasing the optical resolution of a stimulated emission depletion microscope, or STED microscope (Stimulated Emission Depletion), based on the modulation of the intensity of a STED beam on an arbitrary time scale during the acquisition of an image and the analysis of the induced dynamics, without increasing the intensity of the STED beam and in a simple and economic manner.

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Lanzano', Luca. (2022). Method of stimulated emission depletion microscopy having high spatial resolution (U.S. Patent No. 11372224). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11372224

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