The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Sep. 14, 2018
Applicant:

Fujifilm Sonosite, Inc., Bothell, WA (US);

Inventors:

Andrew Lundberg, Woodinville, WA (US);

John Kook, Seattle, WA (US);

Assignee:

FUJIFILM SONOSITE, INC., Bothell, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 42/06 (2021.01); G01S 7/52 (2006.01); G06N 3/08 (2006.01); G01S 15/89 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G01S 7/5205 (2013.01); G01S 7/52053 (2013.01); G01S 15/8911 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01);
Abstract

A processor in an ultrasound imaging system identifies faults or errors in the system. In one embodiment, fault or error conditions are detected by monitoring system parameters during a self-test. In another embodiment, a processor provides ultrasound image data to a trained neural network to identify fault conditions in a transducer or the imaging system. In some embodiments, the processor makes adjustments to one or more operating parameters to compensate for the identified fault conditions so that the system continues to operate and produce images with the detected fault condition.


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