The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Feb. 07, 2019
Applicant:

The Medical College of Wisconsin, Inc., Milwaukee, WI (US);

Inventors:

Kevin M. Koch, Wauwatosa, WI (US);

Andrew S. Nencka, Greendale, WI (US);

Juan Liu, Milwaukee, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/44 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/443 (2013.01); G01R 33/5608 (2013.01);
Abstract

Systems and methods for quantitative susceptibility mapping ('QSM') using magnetic resonance imaging ('MRI') are described. Localized magnetic field information is used when performing the inversion to compute quantitative susceptibility maps. The localized magnetic field information can include multi-resolution subvolumes obtained by segmenting, or dividing, a field shift map. In some instances, a trained machine learning algorithm, such as a trained neural network, can be implemented to convert the localized magnetic field information into quantitative susceptibility data. These local susceptibility maps can be combined to form a composite quantitative susceptibility map of the imaging volume.


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