The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Nov. 15, 2019
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Sung Tae Kim, Daejeon, KR;

Nak Gi Sung, Daejeon, KR;

Joon Sup Kang, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3835 (2019.01); G01R 31/364 (2019.01); G01R 31/52 (2020.01); H01M 10/42 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3835 (2019.01); G01R 31/364 (2019.01); G01R 31/52 (2020.01); H01M 10/4285 (2013.01);
Abstract

A jig pressing-type pressing short-circuiting inspection method includes the steps of: pre-aging battery cells, each of which is manufactured by inserting an electrode assembly in a battery container, injecting an electrolyte into the battery container, and sealing the battery container. The method includes inserting the plurality of battery cells in an active jig; pressing the active jig; and inspecting electric current of the battery cells. The inspection method permits detection of a low-voltage defect of a battery cell in a pre-aging state, which shows a high voltage regulation per capacity, thus greatly reducing the inspection time, and enabling simultaneous inspection of a plurality of battery cells. In addition, a micro-defect occurring in a stack-folding type battery cell can be accurately detected, which is difficult to be detected by the conventional inspection method.


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