The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Jul. 06, 2020
Applicant:

Microwave Measurement Systems Llc, State College, PA (US);

Inventor:

Vasundara V Varadan, State College, PA (US);

Assignee:

Microwave Measurements Systems LLC, State College, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 29/0871 (2013.01);
Abstract

Embodiments of the present invention may provide an antenna characterization system. The system may include a horn antenna including a waveguide and a horn section with an open end and at least one lens disposed at the open end of the horn antenna, having a focal length. The system may also include a platform to hold an antenna under test (AUT) positioned at substantially distance x from the open end of the horn antenna, wherein x is the sum of the focal length and a far-field distance property of the AUT. The system may further include an analyzer coupled to the horn antenna to measure a radiation pattern and other properties such as EIRP, TRP, EVR and spurious emission of a passive or active AUT.


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