The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Jun. 30, 2020
Applicant:
Hamamatsu Photonics K.k., Hamamatsu, JP;
Inventors:
Atsushi Nakanishi, Hamamatsu, JP;
Hiroshi Satozono, Hamamatsu, JP;
Assignee:
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G01N 21/3581 (2013.01); G01N 2021/558 (2013.01); G01N 2201/06113 (2013.01);
Abstract
Provided is a polymer resin orientation evaluation method including: setting an axis intersecting a front surface of an object to be inspected as an inspection axis, and acquiring an optical characteristic value of the object to be inspected with respect to a plurality of polarization directions of a terahertz wave around the inspection axis; and evaluating orientation of a polymer resin that constitutes the object to be inspected on the basis of a variation amount of the optical characteristic value with respect to change of the polarization direction.