The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Jun. 27, 2019
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Friedrich-schiller-universitaet, Jena, DE;
Falk Eilenberger, Jena, DE;
Markus Graefe, Jena, DE;
Frank Setzpfandt, Jena, DE;
Thomas Pertsch, Hermsdorf, DE;
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V., Munich, DE;
FRIEDRICH-SCHILLER-UNIVERSITAET, Jena, DE;
Abstract
An optical assembly for the illumination and hyperspectral evaluation of an object, having a light source or an optical element at which a light source radiates, wherein the light source or the optical element is designed to divide pairs of unambiguously assignable photons into a first light beam and a second light beam so that the first light beam hits a first detector system and the second light beam is directed at an object and light radiation coming from the object is directed at an optical element which spectrally decomposes light radiation and, from the optical element spectrally decomposing said light radiation, is directed at a second detector system. The first light beam can also be directed at a spectrally decomposing optical element and, from there, at a first detector system, and the light radiation coming from the object can be directed directly at the second detector system. The first detector system is designed to perform a spatially resolved sensing of the first light beam, and the first detector system or the second detector system is designed to perform a spectrally resolved sensing of the second light beam. The detector systems are connected to an electronic evaluation unit, by means of which the measurement signals captured with spatial and spectral resolution are associated. The first and second light beams are spectrally, spatially and temporally correlated.