The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Feb. 19, 2019
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Yu-Hwa Lo, La Jolla, CA (US);

Yuanyuan Han, La Jolla, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/254 (2018.01); G01N 15/14 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1475 (2013.01); G01N 15/147 (2013.01); H04N 13/254 (2018.05); G01N 2015/1006 (2013.01); G01N 2015/145 (2013.01); G01N 2015/1445 (2013.01);
Abstract

Disclosed are methods, devices, systems and applications for camera-less, high-throughput three-dimensional imaging of particles in motion. In some aspects, a system includes a particle motion device to allow particles to move along a travel path; an optical illumination system to produce an asymmetric illumination area of light in a region of the travel path of a particle that scans over a plurality of sections of the particle at multiple time points while the particle is moving; an optical detection system optically interfaced with the particle motion device to obtain optical signal data associated with different parts of the particle corresponding to the particle's volume during motion in the travel path; and a data processing unit to process the optical signal data obtained by the optical detection system and produce data including information indicative of 3D features of the particle.


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