The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Mar. 20, 2019
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Hisao Arai, Kanagawa, JP;
Yi Hu, Kanagawa, JP;
Ken Okada, Kanagawa, JP;
Mayumi Katayama, Kanagawa, JP;
Tsukasa Kitahashi, Kanagawa, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); A61B 5/00 (2006.01); A61B 5/107 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); A61B 5/0064 (2013.01); A61B 5/1077 (2013.01); A61B 5/1079 (2013.01); A61B 5/444 (2013.01); A61B 5/70 (2013.01); A61B 5/7445 (2013.01); A61B 2503/40 (2013.01);
Abstract
A measuring device includes a measuring unit that measures the morphology of a convex portion, and a position fixing unit that includes an opening in which the convex portion is to be disposed and a fixing member which includes the opening at a center thereof and against which the periphery of the convex portion is to be pressed. The size of the opening of the position fixing unit is capable of being changed.