The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
May. 18, 2021
Valmet Automation Oy, Espoo, FI;
Toni Muotio, Tampere, FI;
VALMET AUTOMATION OY, Espoo, FI;
Abstract
A measuring device for measuring thickness of a planar object, where the measuring device comprises a first optical sensor module and a second optical sensor module that located on opposites of the measured planar object with mutual distance the optical sensor modules having at least one light source, a reference shade with two dimensional pattern and an imaging sensor and computing equipment, where the one light source is set to an angle towards measured object and the reference shade is set between the light and the object so that a shadow forms on the surface of the object and the imaging sensor is set so it can detect the reference shade and the shadow while the computing equipment calculates the distance between the surface of the object and sensor module from the distance between the detected shade and shadow of both optical modules and calculate the thickness of the object.