The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Dec. 19, 2019
Siemens Healthcare Gmbh, Erlangen, DE;
Bernd Schreiber, Forchheim, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
A method for the reduction of streak artifacts in an image data set reconstructed from projection images of an X-ray device is provided. The method includes determining a first interim data set by applying a non-linear low-pass filter to pixels that satisfy a selection condition. A second non-linear, high-pass-filtered interim data set is determined by pixel-by-pixel subtraction of the first interim data set from the image data set. The second interim data set is Fourier transformed in order to obtain a spatial frequency data set. Frequency portions attributable to artifacts in the spatial frequency data set are removed, and the processed spatial frequency data set is inverse Fourier transformed, such that a third interim data set is obtained. An artifact-reduced result data set is determined by addition of the third interim data set and the first interim data set.