The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Dec. 05, 2017
Applicants:

Screen Holdings Co., Ltd., Kyoto, JP;

National University Corporation Tottori University, Tottori, JP;

Inventors:

Tetsuya Ohbayashi, Tottori, JP;

Yasushi Kuromi, Kyoto, JP;

Masayoshi Kobayashi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); C12N 5/071 (2010.01); G01B 9/02091 (2022.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0066 (2013.01); A61B 5/0073 (2013.01); C12N 5/0686 (2013.01); G01B 9/02091 (2013.01); G01N 33/5082 (2013.01); C12N 2513/00 (2013.01);
Abstract

It is provided a technique capable of noninvasively and quantitatively evaluating the state of cultured three-dimensional cell-based structure. A method of evaluating a three-dimensional cell-based structure according to the present invention comprises: performing tomography of the cultured three-dimensional cell-based structure (step S); generating stereoscopic data indicating the three-dimensional shape of the three-dimensional cell-based structure based on image data acquired by the tomography (step S); and counting the number of structures isolated from each other in the three-dimensional cell-based structure based on the stereoscopic data (step S).


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