The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Jun. 17, 2016
Nutanix, Inc., San Jose, CA (US);
Biswa Ranjan Panda, Mountain View, CA (US);
Karan Gupta, San Jose, CA (US);
Abhinay Nagpal, San Jose, CA (US);
Deepthi Srinivasan, Raleigh, NC (US);
Roger Sean Liao, Durham, NC (US);
Vinayak Hindurao Khot, Sunnyvale, CA (US);
Nutanix, Inc., San Jose, CA (US);
Abstract
Systems for cluster computing. A method for detection and remediation of degraded nodes in a cluster commences upon measuring operational aspects of the nodes in the cluster, then determining, based on the measurements and other factors, a suspect set of nodes comprising one or more suspect nodes from the nodes in the cluster that have measurements that are determined to be outliers with respect to remaining nodes that are determined not to be the outliers. A density-based spatial clustering analysis is performed over the suspect set and remediation actions are initiated when results of the density-based spatial clustering analysis identifies a suspect node as being a degraded node.