The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Sep. 09, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Yongsoo Kim, Osan-si, KR;

Juyeon Lee, Suwon-si, KR;

Mijung Noh, Yongin-si, KR;

Yongki Lee, Suwon-si, KR;

Yunhyeok Choi, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01); H04L 9/08 (2006.01); G06F 21/44 (2013.01); G06F 21/73 (2013.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); G06F 21/44 (2013.01); G06F 21/73 (2013.01); H04L 9/0866 (2013.01); H04L 2209/12 (2013.01);
Abstract

The present disclosure relates to an integrated circuit and a method of using the integrated circuit used to perform authentication using a challenge-response method. The challenge-response method includes an internal challenge generator, a physically unclonable function (PUF) block, and a response generator. The internal challenge generator is configured to receive a challenge, generate a plurality of internal challenges corresponding to the challenge, and generate at least one valid internal challenge among the plurality of internal challenges using screen information. The physically unclonable function (PUF) block is configured to generate a plurality of valid internal responses respectively changing according to the plurality of valid internal challenges. The response generator is configured to output a response generated using the plurality of valid internal responses.


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