The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Sep. 30, 2020
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventor:

Toshihiro Shimura, Yokohama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/12 (2015.01); H01Q 3/26 (2006.01); H04B 17/10 (2015.01); H01Q 3/28 (2006.01); H01Q 3/38 (2006.01); H01Q 1/24 (2006.01); H04L 25/02 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); H01Q 3/28 (2013.01); H01Q 3/38 (2013.01); H04B 17/103 (2015.01); H04B 17/12 (2015.01); H01Q 1/246 (2013.01); H04L 25/0272 (2013.01);
Abstract

An antenna device includes: a first variable phase amplifier that outputs a first signal to a first transmission line without outputting a second signal to a second transmission line; a second variable phase amplifier that outputs a fourth signal to a fourth transmission line without outputting a third signal to a third transmission line; a phase comparator that acquires a first reflected signal that is obtained by reflecting the first signal by a first antenna element from the second transmission line, acquires a second reflected signal that is obtained by reflecting the fourth signal by a second antenna element from the third transmission line, and detects a phase difference between the first and the second antenna elements based on the first and the second reflected signals; and a phase amplitude controller that calibrates a phase between the first and the second antenna elements based on the detected phase difference.


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