The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Oct. 15, 2021
Applicant:
Cape Analytics, Inc., Mountain View, CA (US);
Inventors:
Giacomo Vianello, Mountain View, CA (US);
Robert Davis, Mountain View, CA (US);
John K. Clark, Mountain View, CA (US);
Jonathan M. Fisher, Mountain View, CA (US);
Assignee:
Cape Analytics, Inc., Mountain View, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06V 10/22 (2022.01); G06T 7/50 (2017.01); G06K 9/62 (2022.01); G06F 30/13 (2020.01); G06V 10/25 (2022.01); G06V 10/26 (2022.01); G06V 20/10 (2022.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06V 10/22 (2022.01); G06F 30/13 (2020.01); G06K 9/6232 (2013.01); G06K 9/6267 (2013.01); G06T 7/50 (2017.01); G06V 10/25 (2022.01); G06V 10/273 (2022.01); G06V 20/176 (2022.01); G06V 20/188 (2022.01); G06N 20/00 (2019.01);
Abstract
In variants, the method for automatic debris detection includes: determining a region image; optionally determining a parcel representation for the region image; generating a debris representation using the region image; generating a debris score based on the debris representation; and optionally monitoring the debris score over time.