The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Nov. 24, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hiroaki Itsuji, Tokyo, JP;

Takumi Uezono, Tokyo, JP;

Tadanobu Toba, Tokyo, JP;

Kenichi Shimbo, Tokyo, JP;

Yutaka Uematsu, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/73 (2017.01); G06T 7/77 (2017.01); G06V 20/58 (2022.01); G06V 20/56 (2022.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06T 7/77 (2017.01); G06V 20/58 (2022.01); G06V 20/588 (2022.01); G06T 2207/30261 (2013.01);
Abstract

To detect a discrimination error in a type of an object. A calculation system includes a first device and a second device. The first device includes: a first object map generation unit configured to calculate, using first image information that is image information acquired by the first device, a first object map indicating a type of an object and a position of the object; and a first communication unit configured to transmit the first object map to the second device. The second device includes: a second object map generation unit configured to calculate, using second image information that is image information acquired by the second device, a second object map indicating a type of an object and a position of the object; and a comparison unit configured to compare the first object map and the second object map.


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