The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Dec. 28, 2019
Applicant:

Shanghai United Imaging Intelligence Co., Ltd., Shanghai, CN;

Inventors:

Minqing Zhang, Shanghai, CN;

Qin Liu, Shanghai, CN;

Dijia Wu, Shanghai, CN;

Yiqiang Zhan, Shanghai, CN;

Xiang Sean Zhou, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/73 (2017.01); G06T 3/40 (2006.01); G06T 7/11 (2017.01); G16H 10/60 (2018.01); G16H 30/00 (2018.01); G06V 10/40 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 3/4007 (2013.01); G06T 7/11 (2017.01); G06T 7/74 (2017.01); G06V 10/40 (2022.01); G16H 10/60 (2018.01); G16H 30/00 (2018.01); G06T 2207/20084 (2013.01); G06T 2207/20104 (2013.01); G06T 2207/30008 (2013.01);
Abstract

Systems and methods for ossification center detection (OCD) and bone age assessment (BAA) may be provided. The method may include obtaining a bone age image of a subject. The method may include generating a normalized bone age image by preprocessing the bone age image. The method may include determining, based on the normalized bone age image, positions of a plurality of ossification centers using an ossification center localization (OCL) model. The method may include estimating, based on the normalized bone age image and information related to the positions of the plurality of ossification centers, a bone age of the subject using a bone age assessment (BAA) model.


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