The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Sep. 24, 2018
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Martin Haerterich, Wiesloch, DE;

Benjamin Hilprecht, Mannheim, DE;

Daniel Bernau, Karlsruhe, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06V 10/50 (2022.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06K 9/6248 (2013.01); G06K 9/6256 (2013.01); G06N 20/00 (2019.01); G06V 10/507 (2022.01);
Abstract

Various examples are directed to systems and methods for detecting training data for a generative model. A computer system may access generative model sample data and a first test sample. The computer system may determine whether a first generative model sample of the plurality of generative model samples is within a threshold distance of the first test sample and whether a second generative model sample of the plurality of generative model samples is within the threshold distance of the first test sample. The computer system may determine that a probability that the generative model was trained with the first test sample is greater than or equal to a threshold probability based at least in part on whether the first generative model sample is within the threshold distance of the first test sample, the determining also based at least in part on whether the second generative model sample is within the threshold distance of the first test sample.


Find Patent Forward Citations

Loading…