The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Mar. 08, 2019
Headspin, Inc., Palo Alto, CA (US);
Brian Christian Perea, Millbrae, CA (US);
Severin Smith, Toronto, CA;
Brien Colwell, Redwood City, CA (US);
Manish Lachwani, Los Altos, CA (US);
HEADSPIN, INC., Palo Alto, CA (US);
Abstract
A test device may include a performance module to determine entropy values for images, such as of a graphical user interface, to be presented on a display device of the test device. An entropy value for an image may be indicative of a distribution of data values, such as intensity or color values for pixels in the image. Patterns of entropy values over time may provide information indicative of performance of the test device. For example, a constant entropy value over time may indicate the graphical user interface is not changing. In another example, particular patterns of entry values over time may be indicative of presentation of wait indicators or other user interface elements. The entropy values may be used to determine data indicative of performance of the test device. This data may be stored locally, sent to an external device, and so forth.