The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Dec. 02, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Mudhakar Srivatsa, White Plains, NY (US);

Raghu Kiran Ganti, White Plains, NY (US);

Jae-Wook Ahn, Nanuet, NY (US);

Shreeranjani Srirangamsridharan, White Plains, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 16/18 (2019.01); H04L 41/069 (2022.01); G06F 40/186 (2020.01); G06F 40/242 (2020.01);
U.S. Cl.
CPC ...
G06F 11/0772 (2013.01); G06F 11/0709 (2013.01); G06F 16/1865 (2019.01); G06F 40/186 (2020.01); G06F 40/242 (2020.01); H04L 41/069 (2013.01);
Abstract

A method for obtaining information and status about a monitored system by adaptively analyzing log messages is provided. A log analyzer receives log messages generated by a monitored system. The log analyzer identifies static and variable portions in the received log messages. The log analyzer generates a template based on the identified static and variable portions of the received log messages. The log analyzer computes a metric for the generated template based on a number of log messages that fall within the template. The log analyzer reports a status in the monitored system based on the computed metric.


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