The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Jun. 22, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Vamsi K. Vankamamidi, Hopkinton, MA (US);

Shuyu Lee, Acton, MA (US);

Kurt W. Everson, Richmond, TX (US);

Pavan Kumar Vutukuri, Chelmsford, MA (US);

Andrew P. Kubicki, Westborough, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 9/48 (2006.01); G06F 11/10 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0649 (2013.01); G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 3/0689 (2013.01); G06F 9/4881 (2013.01); G06F 11/1092 (2013.01); G06F 11/1662 (2013.01);
Abstract

An apparatus comprises at least one processing device comprising a processor coupled to a memory; the at least one processing device being configured to: obtain a set of rebuild rate parameters for a given storage device from a storage array comprising a plurality of storage devices; and dynamically regulate a rebuild rate associated with a rebuild process for the given storage device based on the set of rebuild rate parameters obtained from the storage array for the given storage device. For example, the set of rebuild rate parameters include a rebuild capacity parameter and a rebuild time parameter.


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