The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Jan. 30, 2019
Applicant:
Rebus Biosystems, Inc., Santa Clara, CA (US);
Inventors:
Assignee:
Rebus Biosystems, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/18 (2006.01); G02B 21/36 (2006.01); G02B 27/58 (2006.01); G06T 7/00 (2017.01); G03F 7/20 (2006.01); G06V 10/60 (2022.01); G06V 10/145 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/18 (2013.01); G02B 21/365 (2013.01); G02B 27/58 (2013.01); G03F 7/70408 (2013.01); G06T 7/0012 (2013.01); G06V 10/145 (2022.01); G06V 10/60 (2022.01); G06V 20/695 (2022.01); G06T 2207/10056 (2013.01); G06T 2207/30072 (2013.01);
Abstract
A particle detection method detects presence and location of particles on a target using measured signals from a plurality of structured illumination patterns. The particle detection method uses measured signals obtained by illuminating the target with structured illumination patterns to detect particles. Specifically, the degree of variation in these measured signals in raw images is calculated to determine whether a particle is present on the target at a particular area of interest.