The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Oct. 10, 2016
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventor:

Felix Neugart, Mannheim, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 27/10 (2006.01); G02B 21/36 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G02B 21/367 (2013.01); G02B 27/106 (2013.01); G02B 27/143 (2013.01);
Abstract

A method for illuminating a sample slice uses a light beam or a light sheet during single plane illumination microscopy (SPIM). The light beam or light sheet is deflected by an angle mirror having a first and second reflective surface reflecting a first and second portion of the light beam or light sheet, respectively, whereby the first and second portions of the light beam or light sheet spatially overlap one another after the deflecting. Alternatively, the light beam or light sheet is refracted by a refractive optical component comprising a first and second refractor surface refracting a first portion of the light beam or light sheet, respectively, whereby the first and second portions of the light beam or light sheet spatially overlap one another after the refracting.


Find Patent Forward Citations

Loading…