The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Sep. 19, 2019
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Assignee:
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/04 (2006.01); G01R 35/00 (2006.01); G01R 23/00 (2006.01);
U.S. Cl.
CPC ...
G01R 35/007 (2013.01); G01R 23/005 (2013.01); G01R 23/04 (2013.01);
Abstract
A setting of a measurement instrument comprises the providing a reference measurement instrument that uses at least one instrument parameter. A training phase is performed for a particular signal type to be processed by said reference measurement instrument in order to retrieve an optimal setting for said at least one instrument parameter. A lookup table is created for said particular signal type, said lookup table comprising at least said optimal setting for said at least one instrument parameter.
Ramian, Florian. (2022). Method of setting a measurement instrument and system for setting a measurement instrument (U.S. Patent No. 11366193). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11366193
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile