The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Sep. 25, 2020
Applicant:

Uih America, Inc., Houston, TX (US);

Inventors:

Hui Liu, Houston, TX (US);

Qi Liu, Houston, TX (US);

Yichen Hu, Houston, TX (US);

Assignee:

UIH AMERICA, INC., Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/485 (2006.01); G01R 33/561 (2006.01); G01R 33/24 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 33/485 (2013.01); G01R 33/243 (2013.01); G01R 33/4828 (2013.01); G01R 33/5616 (2013.01);
Abstract

The present disclosure provides a system for MRI. The system may obtain a plurality of echo signals relating to a subject that are excited by an MRI pulse sequence applied to the subject. The system may perform a quantitative measurement on the subject based on the plurality of echo signals. The MRI pulse sequence may include a CEST module configured to selectively excite exchangeable protons or exchangeable molecules in the subject, an RF excitation pulse applied after the CEST module configured to excite a plurality of gradient echoes, and one or more refocusing pulses applied after the RF excitation pulse. In some embodiments, the quantitative measurement may include determining various quantitative parameters including a T1, a T2, a T2*, an R2 value, an R2* value, an R2', a B0 field, a pH value, an MWF, and an APT simultaneously.


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