The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Jun. 20, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Hiroyuki Minato, Kyoto, JP;

Takashi Inoue, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); B01L 3/00 (2006.01); G01N 30/24 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1011 (2013.01); B01L 3/50853 (2013.01); B01L 2300/044 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/123 (2013.01); G01N 2035/1027 (2013.01);
Abstract

The sample plate has a principal plane in which a plurality of wells is arranged. The sample plate has a plurality of through-holes each allowing a sampling needle to pass through in a region of the principal plane where the wells are not provided, and positions of the wells and positions of the through-holes are designed such that when two pieces of the sample plates are arranged up and down with a predetermined positional relationship in a state in which respective principal planes are arranged in parallel each other, the through-holes of the sample plate arranged on an upper side is arranged at positions directly above respective wells of the sample plate arranged on a lower side.


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