The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Oct. 09, 2018
Nanjing Develop Advanced Manufacturing Co., Ltd., Nanjing, CN;
Changhua Chen, Nanjing, CN;
Li Zhang, Nanjing, CN;
Hong Zhang, Nanjing, CN;
Zhengmao Xu, Nanjing, CN;
Zheng Dong, Nanjing, CN;
Qingyong Chen, Nanjing, CN;
Xiaolei Liu, Nanjing, CN;
Yao Ha, Nanjing, CN;
NANJING DEVELOP ADVANCED MANUFACTURING CO., LTD., Nanjing, CN;
Abstract
A dudou-shaped test block includes a testing structure, a first beam-path structure, and a second beam-path structure. A first arc-shaped groove and a second arc-shaped groove are provided on one side of the testing structure. The other side of the testing structure is a flat surface. The first beam-path structure and the second beam-path structure are both flat plates. A thickness of the first beam-path structure is less than a thickness of the second beam-path structure. The first beam-path structure and the second beam-path structure are both in contact with the flat surface and arranged parallel to the flat surface. The first arc-shaped groove is arranged corresponding to the first beam-path structure, and the second arc-shaped groove is arranged corresponding to the second beam-path structure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile