The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Feb. 22, 2019
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Kentaro Jinno, Tokyo, JP;
Masaaki Kurokawa, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
An eddy current flaw detection probe includes first coils, second coils, and a switching circuit configured to cause the first or the second coils in each unit U, the unit U being composed of adjacent four coils, to serve as excitation coils that generate eddy currents in an inspection target and cause the other coils in the unit U to serve as detection coils that detect a change in the eddy currents. The first coils each have one end thereof connected to a first common wiring, and the second coils each have one end thereof connected to a second common wiring. The switching circuit includes a first switching circuit connected to the other ends of the first coils and the second coils arranged in a first row, and a second switching circuit connected to the other ends of the first coils and the second coils arranged in a second row.