The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Sep. 18, 2018
Applicants:

Imec Vzw, Leuven, BE;

Katholieke Universiteit Leuven, Leuven, BE;

Inventors:

Finub James Shirley, Leuven, BE;

Pol Van Dorpe, Spalbeek, BE;

Assignees:

IMEC VZW, Leuven, BE;

KATHOLIEKE UNIVERSITEIT LEUVEN, Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6428 (2013.01); G01N 21/648 (2013.01); G01N 21/6454 (2013.01); G01N 21/6456 (2013.01); G01N 2021/6421 (2013.01); G01N 2021/6471 (2013.01);
Abstract

An apparatus for detecting fluorescent light emitted from a sample comprises: a light source, which is configured to emit excitation light of an excitation wavelength towards a sample comprising fluorophores such that fluorescent light is induced; a photo-detector for detecting light incident on the photo-detector; and an interference filter arranged on the photo-detector, wherein the interference filter is configured to selectively collect and transmit light towards the photo-detector based on an angle of incidence of the light towards the interference filter, wherein the interference filter is configured to selectively transmit supercritical angle fluorescence from the sample towards the photo-detector and suppress undercritical angle fluorescence from the sample.


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