The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Dec. 08, 2017
Endress+hauser Se+co. KG, Maulburg, DE;
Manuel Sautermeister, Schopfheim, DE;
Winfried Mayer, Buch, DE;
ENDRESS+HAUSER SE+CO. KG, Maulburg, DE;
Abstract
The present disclosure relates to a method for detecting a fault state at an FMCW-based fill level measuring device, including performing two reference measurements successively in time, a first reference measurement signal and a second reference measurement signal, using the filling level measuring device under a predefined reference measurement condition. In each of the two reference measurement signals a characteristic parameter is determined, wherein a change in the characteristic parameter over time is determined by comparing the two reference measurement signals. A fault state is detected when the change in the characteristic parameter exceeds a predefined maximum characteristic parameter change.