The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Jun. 19, 2018
Applicant:
Sandvik Intellectual Property Ab, Sandviken, SE;
Inventors:
Erik Lindahl, Knivsta, SE;
Jan Engqvist, Uppsala, SE;
Assignee:
Sandvik Intellectual Property AB, Sandviken, SE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 16/30 (2006.01); C23C 16/32 (2006.01); C23C 16/34 (2006.01); C23C 16/40 (2006.01); C23C 28/00 (2006.01); B23C 5/00 (2006.01);
U.S. Cl.
CPC ...
C23C 16/403 (2013.01); C23C 16/303 (2013.01); C23C 16/32 (2013.01); C23C 16/34 (2013.01); C23C 28/341 (2013.01); C23C 28/347 (2013.01); C23C 28/42 (2013.01); C23C 28/44 (2013.01); B23C 5/006 (2013.01);
Abstract
A coated cutting tool includes a multilayer of alternating sublayers of κ-AlOand sublayers of TiN, TiC, TiCN, TiCO or TiCNO. The multilayer includes at least 3 sublayers of κ-AlO. The multilayer further exhibits an XRD diffraction over a θ-2θ scan of 15°-140°, wherein the 0 0 2 diffraction peak (peak area) is the strongest peak originating from the κ-AlOsublayers of the multilayer.