The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Oct. 31, 2017
Applicants:

Sumitomo Chemical Company, Limited, Tokyo, JP;

Tanaka Chemical Corporation, Fukui, JP;

Inventors:

Yuichiro Imanari, Ehime, JP;

Yusuke Maeda, Fukui, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C01G 53/04 (2006.01); H01M 4/04 (2006.01); H01M 4/131 (2010.01); H01M 4/1391 (2010.01); H01M 4/505 (2010.01); H01M 4/525 (2010.01); H01M 10/0525 (2010.01); C01G 53/00 (2006.01); H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
C01G 53/04 (2013.01); C01G 53/00 (2013.01); H01M 4/0471 (2013.01); H01M 4/131 (2013.01); H01M 4/1391 (2013.01); H01M 4/505 (2013.01); H01M 4/525 (2013.01); H01M 10/0525 (2013.01); C01P 2004/03 (2013.01); C01P 2004/61 (2013.01); H01M 2004/021 (2013.01);
Abstract

The present invention provides a positive electrode active material precursor for a lithium secondary battery, in which the positive electrode active material precursor is represented by the following composition formula (I), a ratio (α/β) between a half width α of a peak that is present within a range of a diffraction angle 2θ=19.2±1° and a half width β of a peak that is present within a range of 2θ=38.5±1° is equal to or greater than 0.9 in powder X-ray diffraction measurement using a CuKα beam:NiCoMnM(OH)  (I)[0.7≤x<1.0, 0<y≤0.20, 0≤z≤0.20, 0≤w≤0.1, and x+y+z+w=1 are satisfied, and M is one or more selected from the group consisting of Mg, Ca, Sr, Ba, Ti, Zr, V, Nb, Cr, Mo, W, Fe, Ru, Cu, Zn, B, Al, Ga, Si, Sn, P, and Bi].


Find Patent Forward Citations

Loading…