The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Jun. 22, 2018
Applicant:

Brother Kogyo Kabushiki Kaisha, Nagoya, JP;

Inventors:

Yasuo Nishikawa, Nagoya, JP;

Koki Furukawa, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/00 (2014.01); B23K 26/082 (2014.01); B23K 26/70 (2014.01); B23K 26/03 (2006.01); B23K 26/364 (2014.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
B23K 26/082 (2015.10); B23K 26/03 (2013.01); B23K 26/032 (2013.01); B23K 26/364 (2015.10); B23K 26/703 (2015.10); G02B 26/105 (2013.01);
Abstract

A laser machining apparatus includes: a laser beam emission device; a guide beam emission device; a scanner; a processor; and a memory. The memory stores a set of computer-readable instructions therein. The set of computer-readable instructions, when executed by the processor, causes the laser machining apparatus to perform: acquiring workpiece contour information specifying a contour of the workpiece; extracting a plurality of feature points from the workpiece contour information, each of the plurality of feature points being on the contour of the workpiece; generating a guide pattern indicating a setup position of the workpiece according to the plurality of feature points; and drawing the guide pattern with the guide beam by controlling the guide beam emission device and the scanner.


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