The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Dec. 16, 2020
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Daiki Ariyoshi, Chofu, JP;

Risa Arai, Tama, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); G06T 7/90 (2017.01); A61B 1/05 (2006.01); A61B 1/06 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 1/00006 (2013.01); A61B 1/0005 (2013.01); A61B 1/05 (2013.01); A61B 1/0638 (2013.01); G06T 7/0012 (2013.01); G06T 7/90 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/10152 (2013.01);
Abstract

An endoscope system includes a light source configured to generate either one of first illumination light and second illumination light, an image pickup apparatus configured to obtain an image by picking up an image of an object, and a processor. The processor is configured to make an instruction to set an observation mode of the endoscope system at either one of a first observation mode and a second observation mode, detect an observation state at a time of observing the object based on a feature value calculated from pixel values included in pixels forming a first image, and invalidate an instruction to set the observation mode of the endoscope system at the second observation mode when the observation state at the time of observing the object is not an appropriate observation state.


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