The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
May. 26, 2020
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Sandra Merkel, Munich, DE;
Daniela Raddino, Munich, DE;
Juergen Schlienz, Munich, DE;
Rabih El-Masri, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method of testing an Integrated Access Backhaul (IAB) node is disclosed, the method including: providing a device under test as well as a test equipment for testing the device under test, wherein the device under test corresponds to an Integrated Access Backhaul (IAB) node to be tested; simulating at least one Integrated Access Backhaul (IAB) donor by the test equipment; simulating a participant by the test equipment, the participant being connected with the device under test; establishing at least one connection between the device under test and the test equipment, wherein a backhaul link is established with the test equipment; configuring link resources for the device under test via configuration information by the test equipment; gathering reception information by the test equipment; and combining the configuration information with the reception information by the test equipment in order to verify correct resource utilization of the device under test. Further, a test system for testing an Integrated Access Backhaul (IAB) node is described.