The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Dec. 23, 2020
Applicant:

Facebook Technologies, Llc, Menlo Park, CA (US);

Inventors:

Yuri Toride, Redmond, WA (US);

Chuming Zhao, Redmond, WA (US);

Assignee:

Facebook Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 29/00 (2006.01); H04R 19/04 (2006.01); H04R 1/10 (2006.01); H04R 17/02 (2006.01); H04R 1/04 (2006.01); H04R 1/08 (2006.01);
U.S. Cl.
CPC ...
H04R 29/004 (2013.01); H04R 1/04 (2013.01); H04R 1/08 (2013.01); H04R 1/1008 (2013.01); H04R 17/02 (2013.01); H04R 19/04 (2013.01); H04R 2201/003 (2013.01);
Abstract

A piezoelectric microelectromechanical systems (MEMS) transducer that can operate as a microphone (e.g., contact microphone) or a speaker is presented herein. The piezoelectric MEMS transducer includes a substrate, a proof mass and folded displacement sensing structures. Each folded displacement sensing structure comprises a continuous beam, a first piezoelectric stress sensor coupled to a first portion of the continuous beam, and a second piezoelectric stress sensor coupled to a second portion of the continuous beam. The first portion of the continuous beam is coupled to a respective portion of the proof mass, and the second portion of the continuous beam is coupled to a respective portion of the substrate. The first and second portions of the continuous beam come together at an acute angle. The first and second piezoelectric stress sensors output stress information responsive to a stress induced in the continuous beam by displacement of the proof mass.


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