The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Feb. 26, 2020
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

John Wade Cherrington, Salt Spring Island, CA;

Ankur Jain, Gurgaon, IN;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 41/12 (2022.01); H04L 67/01 (2022.01);
U.S. Cl.
CPC ...
H04L 41/12 (2013.01); H04L 67/42 (2013.01);
Abstract

High performance and scalable multi-layer topology discovery systems and methods provide awareness of what services are present across a multi-layer network. The present disclosure achieves a high level of performance in service discovery, and, in addition, provides a form of scalability in proportion to network size by distributing service observation across servers in a cluster. The present disclosure defines a concept of change-proportional online run-time efficiency and thus provides an optimal design. Further, the present disclosure achieves horizontal scale, leveraging multiple cores across multiple servers.


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