The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
May. 01, 2020
Applicant:
Daniel J Kane, Santa Fe, NM (US);
Inventor:
Daniel J Kane, Santa Fe, NM (US);
Assignee:
MESA PHOTONICS, LLC, Santa Fe, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/10 (2006.01); H01S 3/11 (2006.01); H01S 3/00 (2006.01);
U.S. Cl.
CPC ...
H01S 3/11 (2013.01); H01S 3/0057 (2013.01); H01S 3/0078 (2013.01); H01S 3/10023 (2013.01);
Abstract
A pulse analysis system or method includes a frequency filter that receives an ultrafast pulse under test and disperses the pulse under test over a frequency range. The frequency filter separates the pulse under test into component frequency slices and provides the frequency slices to a detector coupled to a digitizer, which processes the digitized signal and collects a sonogram characteristic of the pulse under test. The frequency slices are arranged to overlap. Ptychography is performed on the sonogram to obtain characteristics of the pulse under test.