The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Sep. 18, 2019
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Song Mei, Franklin Park, NJ (US);

Zaixing Mao, Edgewater, NJ (US);

Ying Dong, Warren, NJ (US);

Zhenguo Wang, Ridgewood, NJ (US);

Kinpui Chan, Ridgewood, NJ (US);

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06T 7/11 (2017.01); G06T 5/20 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G06T 5/20 (2013.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 2207/10101 (2013.01); G06T 2207/30041 (2013.01); G06T 2207/30088 (2013.01);
Abstract

Shadows caused by opacities and obstructions (such as blood vessels) can block detection of structural information of objects below the shadow-causing structure, affecting visualization and analysis of those deeper structures. An image processing method for removing these shadows includes applying a low pass filter to an energy profile of an image to remove high frequency fluctuations in energy, thereby effectively recovering lower energy inside shadow regions and removing high frequency speckle. The image is then adjusted, for example by linear scaling, based on the filtered energy profile. Two dimensional filters may also be applied for volumes.


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