The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Jul. 27, 2020
Applicant:

Recursion Pharmaceuticals, Inc., Salt Lake City, UT (US);

Inventors:

Benjamin Marc Feder Fogelson, South Salt Lake City, UT (US);

Peter McLean, Centerville, UT (US);

Imran Haque, Salt Lake City, UT (US);

Marissa Saunders, South Salt Lake City, UT (US);

Eric Fish, Salt Lake City, UT (US);

Charles Baker, Millcreek, UT (US);

Juan Sebastián Rodríguez Vera, Sandy, UT (US);

Assignee:

RECURSION PHARMACEUTICALS, INC., Salt Lake City, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06V 20/698 (2022.01); G06T 2200/24 (2013.01); G06T 2207/20064 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30242 (2013.01);
Abstract

In various embodiments, an experiment analysis application detects executional artifacts in experiments involving microwell plates. The experiment analysis application computes one or more sets of spatial features based on one or more heat maps associated with a microwell plate. The experiment analysis application then aggregates the set(s) of spatial features to generate a feature vector. The experiment analysis application inputs the feature vector into a trained classifier. In response, the trained classifier generates a label indicating that the microwell plate is associated with a first executional artifact.


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