The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
Apr. 24, 2019
Climate Llc, San Francisco, CA (US);
Sivan Aldor-Noiman, Foster City, CA (US);
Erik Andrejko, Oakland, CA (US);
Climate LLC, San Francisco, CA (US);
Abstract
A method and system for modeling trends in crop yields is provided. In an embodiment, the method comprises receiving, over a computer network, electronic digital data comprising yield data representing crop yields harvested from a plurality of agricultural fields and at a plurality of time points; in response to receiving input specifying a request to generate one or more particular yield data; determining one or more factors that impact yields of crops that were harvested from the plurality of agricultural fields; decomposing the yield data into decomposed yield data that identifies one or more data dependencies according to the one or more factors; generating, based on the decomposed yield data, the one or more particular yield data; generating forecasted yield data or reconstructing the yield data by incorporating the one or more particular yield data into the yield data.