The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Sep. 19, 2018
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Takashi Koide, Musashino, JP;

Daiki Chiba, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 21/56 (2013.01); G06F 21/12 (2013.01); G06F 21/44 (2013.01); H04L 67/02 (2022.01); H04L 67/146 (2022.01);
U.S. Cl.
CPC ...
G06F 21/563 (2013.01); G06F 21/125 (2013.01); G06F 21/128 (2013.01); G06F 21/44 (2013.01); H04L 67/02 (2013.01); H04L 67/146 (2013.01); G06F 2221/2119 (2013.01);
Abstract

An analysis apparatus includes a category classification unit that accesses a URL of an analysis target Web page and classifies the analysis target Web page into a category, an operation target detection unit that detects an operation target of user operation from the analysis target Web page in accordance with a detection method that is set in advance for the classified category, an operation execution unit that performs operation on the detected operation target, a function hook unit that detects an operation event that occurs after the operation has been performed on the operation target, and a log output unit that outputs log data in which communication that has occurred due to the operation, the detected operation event, and a Web browser screen that has been changed due to the operation are associated with the URL of the analysis target Web page.


Find Patent Forward Citations

Koide, Takashi. (2022). Analysis apparatus, analysis method, and analysis program (U.S. Patent No. 11361073). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11361073

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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