The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Apr. 01, 2019
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Johannes Merx, Heidelberg, DE;

Taehyung Lee, Seoul, KR;

Sung Heun Wi, Gyeonggi, KR;

Jin Uk Bae, Seoul, KR;

Ki Hong Kim, Seoul, KR;

Stefan Baeuerle, Rauenberg, DE;

Florian Scheid, Wiesloch, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24542 (2019.01); G06F 16/24537 (2019.01);
Abstract

Implementations of the present disclosure include receiving, by a query processing server, a first query, the first query including a syntax indicating that precision loss is allowed, processing, by the query processing server, the first query to provide a first QEP, optimization of which would result in precision loss in a generated query result, determining that the syntax is provided, and in response, optimizing the first QEP to provide an optimized QEP, executing the optimized QEP to generate a query result that includes data stored within a database system, the query result having reduced accuracy relative to a query result that would be generated based on the first QEP, and providing the query result as output from the database system.


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