The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Mar. 18, 2016
Applicant:

Arm Limited, Cambridge, GB;

Inventors:

Michele Riga, Cambridge, GB;

Kauser Yakub Johar, Cambridge, GB;

Assignee:

Arm Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); H03M 13/13 (2006.01); H03M 13/00 (2006.01); H03M 13/35 (2006.01); H03M 13/29 (2006.01); G06F 11/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1076 (2013.01); G06F 11/1012 (2013.01); H03M 13/13 (2013.01); H03M 13/2906 (2013.01); H03M 13/35 (2013.01); H03M 13/356 (2013.01); H03M 13/618 (2013.01); H03M 13/6368 (2013.01);
Abstract

An error protection key generation method and system are provided, the method being used to generate a key for use in computing an error protection code for an input data value according to a chosen error protection scheme. The method comprises inputting a plurality of desired data value sizes, and then applying a key generation algorithm to generate a key for use in computing the error protection code for a maximum data value size amongst the plurality of data value sizes. The key generation algorithm is arranged so that it generates the key so as to comprise a plurality of sub-keys, where each sub-key is associated with one of the input data value sizes, and where each sub-key conforms to a key requirement of the error protection scheme. As a result, a generic key is produced containing a plurality of sub-keys, where each sub-key is associated with a particular desired data value size, and can be extracted and used independently given that each sub-key conforms to the error protection scheme requirements. This provides significant benefits in the design and verification of error protection circuits using such keys.


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